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Nanoparticle Physical Property Evaluation Device "NANOTRAC WAVE II Series"

Demo/Analysis Now Available! Dynamic Light Scattering! Advanced technologies such as the heterodyne method and frequency analysis method have been adopted as measurement principles.

In the expanding world of nanotechnology, the "NANOTRAC WAVE II" has been developed as an evolution of the well-regarded UPA series that has been trusted by our customers. It employs advanced technologies such as the heterodyne method and frequency analysis as its measurement principles. Achieving a wide range of concentration measurements with high precision and high resolution, we deliver the hidden potential of nanotechnology to our customers through the technical expertise and quality cultivated over many years of experience. 【Features】 ■ Measurement principle (Dynamic Light Scattering: DLS) ■ Stable data from low to high concentrations ■ Adoption of the heterodyne method ■ Background measurement ■ Use of a unique frequency analysis algorithm *For more details, please refer to the PDF document or feel free to contact us.

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